Microscopy of Semiconducting Materials, 1995 by A.G. Cullis & A.E.S-. Bevan & A.E.Staton- Bevan

This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. It contains both invited review papers, as well as in-depth coverage of recent research results. The book encompasses techniques from transmission and scanning electron microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.
`Author(s) :`	`Format :` Hardback Book
`ISBN-10 :` 0750303476	`ISBN-13 :` 9780750303477
`RRP :` £90.00	`Best available price :` £ / $
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Product Details:

Series Title : Institute of Physics Conference S.

Country Publication : United Kingdom

Publication Date : 25/01/1996

Publisher : Taylor & Francis Ltd

Page Length : ixx,797mm

Page Size : 230mm