Beam Effects, Surface Topography and Depth Profiling in Surface Analysis by Alvin W. Czanderna & Theodore E. Madey & Cedric J. Powell

This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.
`Author(s) :` Alvin W. Czanderna	`Format :` Hardback Book
`ISBN-10 :` 0306458969	`ISBN-13 :` 9780306458965
`RRP :` £100.00	`Best available price :` £ / $
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Product Details:

Series Title : Methods of Surface Characterization S.

Country Publication : Netherlands

Publication Date : 01/10/1998

Publisher : Kluwer Academic Publishers Group

Page Length : 450mm

Page Size : 241mm