GeSi Strained Layers and Their Applications by A.M. Stoneham & S.C. Jain

GeSi Strained Layers and Their Applications This is a collection of 49 recently-published research papers dealing with silicon-germanium strained layers and their applications. The text is divided into sections on the growth and mechanical properties of strained layers, electronic and optical properties, and various applications.

This volume presents 49 key papers published in recent years dealing with silicon-germanium strained layers and their applications. The papers have been selected by Professor Suresh Jain of Oxford University, who also provides a brief review of SiGe strained layers technology to place all the papers in an appropriate context. Papers are presented in three groups, dealing with growth and mechanical properties of strained layers, electronic and optical properties, and applications, notably in novel diode and transistor designs, and high performance optical detectors. An important aspect of the selection is the cross-disciplinary nature of the papers, presenting material from electronic engineers as well as from physicists and materials scientists. An extensive bibliography gives details of a further 250 papers on the subject.
Author(s) : A.M. Stoneham & S.C. Jain Format : Hardback Book
ISBN-10 : 0750300248 ISBN-13 : 9780750300247
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Product Details:

Country Publication : United Kingdom

Publication Date : 01/01/1995

Publisher : Taylor & Francis Ltd

Page Length : 384mm

Page Size : 234mm