International Workshop on Memory Technology, Design and Testing by Institute of Electrical and Electronics Engineers

International Workshop on Memory Technology, Design and Testing This volume contains the conference proceedings of the 2001 IEEE International Workshop on Memory Technology, Design and Testing.
Author(s) : Institute of Electrical and Electronics Engineers Format : Paperback Book
ISBN-10 : 0769512429 ISBN-13 : 9780769512426
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Product Details:

Series Title : IEEE Conference Proceedings

Country Publication : United States

Publication Date : 30/09/2001

Publisher : I.E.E.E.Press

Page Length : 118mm

Page Size : 230mm