Three-dimensional Imaging, Optical Metrology, and Inspection by Kevin G. Harding & Donald J. Svetkoff

Three-dimensional Imaging, Optical Metrology, and Inspection Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.

Author(s) : Kevin G. Harding & Donald J. Svetkoff Format : Paperback Book
ISBN-10 : 0819429813 ISBN-13 : 9780819429810
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Product Details:

Series Title : Proceedings of SPIE

Country Publication : United States

Publication Date : 31/05/1999

Publisher : SPIE Press

Page Length : 314mm

Page Size : 230mm