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Quantitative x-Ray Diffractometry by L.S. Zevin & G. Kimmel
This text on quantitative x-ray diffractometry shows how the technique can be used to solve the problem of only the intensity of the diffraction pattern being capable of being measured.One of the most important techniques for determining the atomic structure of a material is x-ray diffraction; however, one of the great problems of the technique is the fact that only the intensity of the pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative x-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. |
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| Author(s) : | Format : Hardback Book |
| ISBN-10 : 0387945415 | ISBN-13 : 9780387945415 |
| RRP : £51.50 | Best available price : £ / $ |
| Prices as of : BST check live prices | |
Product Details:
Country Publication : United States
Publication Date : 31/12/1995
Publisher : Springer-Verlag New York Inc.
Page Length : 300mm