International Conference on Applied Optical Metrology by P.K. Rastogi & Ferenc Gyimesi

International Conference on Applied Optical Metrology This text brings together 77 papers from the 1998 International Conference on Applied Optical Metrology. They examine topics such as the state of the art in optical metrology, optical methods for the testing of microsystem elements, and fibre optic sensors and their applications.
Author(s) : P.K. Rastogi Format : Paperback Book
ISBN-10 : 0819428590 ISBN-13 : 9780819428592
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Product Details:

Series Title : Proceedings of SPIE

Country Publication : United States

Publication Date : 31/05/1999

Publisher : SPIE Press

Page Length : 566mm

Page Size : 230mm