VLSI Testing by S.L. Hurst

Digital and Mixed Analogue/Digital Techniques

VLSI Testing Designed to introduce all aspects of the theory and practice of microelectronic testing to students, this text contains sufficient material on more advanced concepts to appeal to postgraduates involved in design and test research.

This book is a self-contained introduction to all aspects of microelectronic (IC) testing. It includes the theory necessary for advanced students as well as reference to industrial practice and economics that will interest designers in industry. Chapters cover both digital circuit testing and the growing area of mixed circuits, used particularly in signal processing.
Author(s) : S.L. Hurst Format : Hardback Book
ISBN-10 : 0852969015 ISBN-13 : 9780852969014
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Product Details:

Series Title : IEE Circuits & Systems S.

Country Publication : United Kingdom

Publication Date : 15/10/1997

Publisher : Institution of Engineering and Technology

Page Length : 560mm

Page Size : 234mm