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Hot Carrier Reliability of MOS VLSI Circuits by Yusuf Leblebici & Sung-Mo Kang
Addresses the issues related to hot-carrier reliability of MOS VLSI circuits.This book is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models.This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, and simulation methods for estimating hot-carrier effects in the circuit environment. The newly emerging approaches to the VLSI design-for-reliability and rule-based reliability diagnosis are also discussed in detail. "Hot-Carrier Reliability of MOS VLSI Circuits" is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models. VLSI designers will benefit from this book since it offers a comprehensive overview of the interacting mechanisms that influence hot-carrier reliability, and also provides useful guidelines for reliable VLSI design. This volume can be used as an advanced textbook or reference for a graduate-level course on VLSI reliability. |
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| Author(s) : | Format : Hardback Book |
| ISBN-10 : 079239352X | ISBN-13 : 9780792393528 |
| RRP : £137.00 | Best available price : £ / $ |
| Prices as of : BST check live prices | |
Product Details:
Series Title : Kluwer International Series in Engineering & Computer Science
Country Publication : Netherlands
Publication Date : 02/06/1993
Publisher : Kluwer Academic Publishers Group
Page Length : 236mm
Page Size : 234mm