International Conference on VLSI Design by Ieee Circuits and Systems Society & PR

Areas covered in this work include: physical design; synthesis; delay test and timing; high-level synthesis; hardware/software co-design; low-power design; verification; VLSI synthesis; testability enhancement; asynchronous design; diagnosis; test and fault modelling; and mixed-signal design.
`Author(s) :` IEEE Circuits and Systems Society	`Format :` Paperback Book
`ISBN-10 :` 0818682248	`ISBN-13 :` 9780818682247
`RRP :` £124.95	`Best available price :` £ / $
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Product Details:

Country Publication : United States

Publication Date : 31/03/1998

Publisher : IEEE Computer Society Press,U.S.

Page Length : 600mm

Page Size : 279mm